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JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
$27.00 $54.00
DDR3 SDRAM STANDARD
$123.00 $247.00
TEMPERATURE, BIAS, AND OPERATING LIFE
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
$37.00 $74.00
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
$40.00 $80.00
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
$43.00 $87.00
ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE
$24.00 $48.00
EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)
DDR2 SDRAM SPECIFICATION
$95.00 $191.00
Glossary of Thermal Measurement Terms and Definitions
EXTERNAL VISUAL
