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Standards Australia, 06/05/2017
Publisher: AS
File Format: PDF
$132.00$264.74
Published:05/06/2017
File Size:1 file , 210 KB
Note:This product is unavailable in Russia, Belarus
LOW TEMPERATURE STORAGE LIFE
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A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
$33.00 $67.00
MARKING PERMANENCY
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SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
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