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AS C366.4-1978

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Acceptance and reliability

Standards Australia, 12/31/1977

Publisher: AS

File Format: PDF

$24.00$48.11


Published:31/12/1977

Pages:13

File Size:1 file , 950 KB

Note:This product is unavailable in Russia, Belarus

This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.

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