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ASTM International, 10/01/2010
Publisher: ASTM
File Format: PDF
$33.00$67.00
Published:01/10/2010
Pages:11
File Size:1 file , 160 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This specification covers a group of requirements that, unless otherwise specified in an individual specification, shall apply to the ASTM product specifications noted below.
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
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Standard Test Method for Measuring Mechanistic Aspects of Scratch/Mar Behavior of Paint Coatings by Nanoscratching
Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy (Withdrawn 2020)
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Standard Test Method for Lead and Cadmium Release from Porcelain Enamel Surfaces
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