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ASTM International, 01/01/1967
Publisher: ASTM
File Format: PDF
$26.00$52.00
Published:01/01/1967
Pages:3
File Size:1 file , 33 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
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Standard Test Method for Protrusion Puncture Resistance of Stretch Wrap Film
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Standard Guide for Transport Packaging Design
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