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ASTM International, 06/01/2020
Publisher: ASTM
File Format: PDF
$52.00$104.00
Published:01/06/2020
Pages:66
File Size:1 file , 2.4 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 Undesirable timing-chain wear has been observed with gasoline, turbocharged, direct-injection (GTDI) engines in field service, and data from correlating laboratory engine tests have shown that chain wear can be affected by appropriately formulated engine lubricating. A laboratory engine test has been developed to provide a means for screening lubricating oils for that specific purpose. The laboratory engine test is 216 h in length, conducted under varying conditions, and the increase in timing-chain length determined at the end of test is the primary result. This test method is commonly known as the Sequence X, Chain Wear (CW) Test.
1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.
1.2.1 Exception-Where there is no direct SI equivalent such as screw threads, national pipe threads/diameters, tubing size, or specified single source equipment.
1.3 Table of Contents:
Section
Scope
1
Referenced Documents
2
Terminology
3
Summary of Test Method
4
Significance and Use
5
Apparatus
6
Test Engine
6.1
Reagents and Materials
7
Preparation of Apparatus
8
Timing-chain Preparation, Installation, and Measurement
8.20
Test Stand Installation
8.21
Electronic Throttle Controller
8.21.17
Temperature Measurement
8.23
Pressure Measurement
8.24
Flowrate Measurement
8.25
Blowby Flowrate
8.26
Stand Calibration
9
Test Procedure
10
Pre-Test Procedure and Engine Break-In
10.1
Engine Start-up Procedures
10.2
Test Sequence
10.3
Engine Shutdown Procedures
10.4
Blowby Flowrate Measurement
10.5
Parameter Logging
10.6
Oil Consumption Calculation
10.7
General Maintenance
10.8
Special Maintenance Procedures
10.9
Blowby Flowrate Adjustment
10.10
Diagnostic Data Review
11
Test Results
12
Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
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Standard Practice for Core Sampling of Graphite Electrodes
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