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ASTM International, 06/01/2015
Publisher: ASTM
File Format: PDF
$24.00$48.00
Published:01/06/2015
Pages:5
File Size:1 file , 120 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.
1.2 Guidelines are given for depth profiling by the following:
Section
Ion Sputtering
6
Angle Lapping and Cross-Sectioning
7
Mechanical Cratering
8
Mesh Replica Method
9
Nondestructive Depth Profiling
10
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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