• ASTM E1543-14(2018)

ASTM E1543-14(2018)

Standard Practice for Noise Equivalent Temperature Difference of Thermal Imaging Systems

ASTM International, 11/01/2018

Publisher: ASTM

File Format: PDF

$30.00$60.00


Published:01/11/2018

Pages:4

File Size:1 file , 130 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

1.1 This practice covers the determination of the noise equivalent temperature difference (NETD; NEΔT) of thermal imaging systems of the conventional forward-looking infrared (FLIR) or other types that utilize an optical-mechanical scanner; it does not include charge-coupled devices or pyroelectric vidicons.

1.2 Parts of this practice have been formulated under the assumption of a photonic detector(s) at a standard background temperature of 295 °K (22 °C). Besides nonuniformity, examinations made at other background temperatures may result in impairment of precision and bias.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

More ASTM standard pdf

ASTM E1577-95(2000)

ASTM E1577-95(2000)

Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis

$25.00 $50.00

ASTM D5652-95(2000)

ASTM D5652-95(2000)

Standard Test Methods for Bolted Connections in Wood and Wood-Base Products

$26.00 $52.00

ASTM D2472-00

ASTM D2472-00

Standard Specification for Sulfur Hexafluoride

$25.00 $50.00

ASTM F81-01

ASTM F81-01

Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers (Withdrawn 2003)

$29.00 $58.00