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ASTM International, 04/01/2009
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/04/2009
Pages:5
File Size:1 file , 85 KB
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1.1 This practice is intended to assist in the preparation of formal plans for contamination control, especially of aerospace critical surfaces. Requirements may be established at the systems level, either by the customer or the systems integrator, or at the subsystem level. Subsystem requirements may be imposed by the responsible subsystem supplier or they may be flowed down from the systems organization (4.7). The extent of detail and level of cleanliness required can vary with the particular application and type of hardware being built, but all aspects of contamination control must be included in a final plan. Therefore, each of the following elements must be considered for inclusion in a contamination control plan (CCP):
1.1.1 Cleanliness requirements for deliverable hardware addressing particulate, molecular, or biological contaminants or combination thereof. Specify contamination limits and any budget allocations.
1.1.2 Implementation plans to achieve, verify, and maintain the specified cleanliness requirements. Specify material and process controls, cleaning techniques, verification tests, protection and prevention plans, transportation controls, and corrective action for discrepancies.
1.1.3 Environmental controls including clean facilities to be used, facility maintenance, and monitoring schedule.
1.1.4 Personnel and operational controls including operating procedures, restrictions, training, motivation, and organizational responsibilities including the organization or individual for implementation and verification of the CCP.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
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