• ASTM E2444-05

ASTM E2444-05

Terminology Relating to Measurements Taken on Thin, Reflecting Films

ASTM International, 05/01/2005

Publisher: ASTM

File Format: PDF

$27.00$54.00


Published:01/05/2005

Pages:3

File Size:1 file , 110 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

More ASTM standard pdf

ASTM C490/C490M-11e1

ASTM C490/C490M-11e1

Standard Practice for Use of Apparatus for the Determination of Length Change of Hardened Cement Paste, Mortar, and Concrete

$30.00 $60.00

ASTM C926-15

ASTM C926-15

Standard Specification for Application of Portland Cement-Based Plaster

$32.00 $65.00

ASTM D3447-01

ASTM D3447-01

Standard Test Method for Purity of Halogenated Organic Solvents (Withdrawn 2004)

$22.00 $45.60

ASTM D1078-01

ASTM D1078-01

Standard Test Method for Distillation Range of Volatile Organic Liquids

$30.00 $60.00