Your shopping cart is empty!
ASTM International, 11/01/2006
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/11/2006
Pages:6
File Size:1 file , 250 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This practice covers a measurement procedure to calibrate the z-scale of an atomic force microscope using Si(111) monatomic step height specimens.
1.2 Applications This procedure is applicable either in ambient or vacuum condition when the atomic force microscope (AFM) is operated at its highest levels of z-magnification, that is, in the nanometer and sub-nanometer ranges of z-displacement. These ranges of measurement are required when the AFM is used to measure the surfaces of semiconductors, optical surfaces, and other high technology components.
1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Standard Performance Specification for Cerebral Stereotactic Instruments
$29.00 $58.00
Standard Guide for Ice Awis Self-Rescue Technique
$25.00 $50.00
Standard Practice for Determining Resistance of Synthetic Polymeric Materials to Fungi
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
$32.00 $65.00