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ASTM International, 11/10/2001
Publisher: ASTM
File Format: PDF
$30.00$60.00
Published:10/11/2001
Pages:10
File Size:1 file , 99 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Test Method for Bulk Electrical Conductivity of Hardened Concrete (Withdrawn 2021)
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Standard Test Method for Trace Impurities in Monocyclic Aromatic Hydrocarbons by Gas Chromatography (Withdrawn 2016)
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