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ASTM International, 12/10/2002
Publisher: ASTM
File Format: PDF
$30.00$60.00
Published:10/12/2002
Pages:10
File Size:1 file , 100 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
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