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ASTM International, 12/10/2002
Publisher: ASTM
File Format: PDF
$30.00$60.00
Published:10/12/2002
Pages:10
File Size:1 file , 100 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Specification for Steel Forgings, Austenitic, for Pressure and High Temperature Parts
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Standard Practice for Derivation of Decision Point and Confidence Limit for Statistical Testing of Mean Concentration in Waste Management Decisions
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Standard Practice for Preparation of Plastics Materials for Electroplating
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Standard Test Method for Hexane/Petroleum Ether Extract in Wet Blue and Wet White
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