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ASTM International, 12/10/2002
Publisher: ASTM
File Format: PDF
$31.00$62.00
Published:10/12/2002
Pages:10
File Size:1 file , 100 KB
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1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Test Method for Determination of Total Sulfur in Aromatic Hydrocarbons and Related Chemicals by Ultraviolet Fluorescence
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Standard Test Methods for Fire Tests of Roof Coverings
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Standard Test Method for Selection and Use of ASTM Standards for the Determination of Flash Point of Chemicals by Closed Cup Methods
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Standard Specification for Low-Carbon Magnetic Iron