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ASTM International, 12/10/2002
Publisher: ASTM
File Format: PDF
$31.00$62.00
Published:10/12/2002
Pages:10
File Size:1 file , 100 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Specification for Castings, Iron-Chromium-Nickel, Corrosion Resistant, for Severe Service
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Standard Specification for Steel Tie Plates, Low-Carbon and High-Carbon Hot-Worked
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Standard Specification for Natural Block Mica and Mica Films Suitable for Use in Fixed Mica-Dielectric Capacitors
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Standard Specification for Seamless Brass Tube [Metric]
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