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ASTM International, 12/01/2003
Publisher: ASTM
File Format: PDF
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Published:01/12/2003
Pages:10
File Size:1 file , 94 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
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