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ASTM International, 12/01/2003
Publisher: ASTM
File Format: PDF
$30.00$60.00
Published:01/12/2003
Pages:10
File Size:1 file , 94 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Methods for Gas Flow Resistance Testing of Filtration Media
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Standard Test Methods for Scavenger Content of Askarels (Withdrawn 2000)
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Standard Specification for Brass Plate, Sheet, Strip, And Rolled Bar
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Standard Test Methods for Determining the Compatibility of Resin/Solvent Mixtures by Precipitation Temperature Cloud Point
