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ASTM International, 01/01/1998
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/01/1998
Pages:10
File Size:1 file , 64 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
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Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)
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