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ASTM International, 01/01/1998
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/01/1998
Pages:10
File Size:1 file , 64 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Standard Practice for Certificate Programs
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Standard Practice for Preparation of Disk Specimens of Steel and Iron for Spectrochemical Analysis by Remelting
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Standard Specification for Solid Wall High Density Polyethylene (HDPE) Conduit Based on Controlled Outside Diameter (OD)
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Standard Test Method for Fineness of Hydraulic Cement and Raw Materials by the 300- micro m (No. 50), 150- micro m (No. 100), and 75- micro m (No. 200) Sieves by Wet Methods
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