ASTM F108-88e1

Test Method for Resistivity of Silicon Epitaxial Layers by the Three-Probe Voltage Breakdown Method (Withdrawn 1993)

ASTM International, 01/01/1988

Publisher: ASTM

File Format: PDF

$32.00$64.00

Published:01/01/1988

Pages:6

File Size:1 file , 140 KB

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