ASTM F121-83e1

Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption (Withdrawn 1989)

ASTM International, 01/01/1983

Publisher: ASTM

File Format: PDF

$28.00$56.00

Published:01/01/1983

Pages:3

File Size:1 file , 140 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

$41.00 $83.00

Standard Test Methods for Polyurethane Raw Materials: Determination of Gardner and APHA Color of Polyols

$30.00 $60.00

Standard Specification for Brass Strip in Narrow Widths and Light Gage for Heat-Exchanger Tubing

$30.00 $60.00

Standard Test Method for Bend Test for Determining the Formability of Copper and Copper Alloy Strip

$26.00 $52.00