• ASTM F1262M-14

ASTM F1262M-14

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

ASTM International, 06/01/2014

Publisher: ASTM

File Format: PDF

$34.00$68.00


Published:01/06/2014

Pages:6

File Size:1 file , 89 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (matl.)/s.

1.1.1 Discussion-This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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