Your shopping cart is empty!
ASTM International, 01/01/2002
Publisher: ASTM
File Format: PDF
$32.00$65.00
Published:01/01/2002
Pages:13
Note:This product is unavailable in Russia, Ukraine, Belarus
This standard was transferred to SEMI (www.semi.org) May 2003
1.1 The purpose of this guide is to list, illustrate, and provide reference for various characteristic features and contaminants that are seen on highly specular silicon wafers. Recommended practices for delineation and observation of these artifacts are referenced. The artifacts described in this guide are intended to parallel and support the content of the SEMI M18. These artifacts and common synonyms are arranged alphabetically in Tables 1 and 2 and illustrated in Figs. 1-68 .
Standard Specification for Platinum-Iridium Electrical Contact Materials
$25.00 $50.00
Standard Practice for Measuring Delaminations in Concrete Bridge Decks by Sounding
Standard Practice for Analysis of Reformed Gas by Gas Chromatography
$30.00 $60.00
Standard Specification for Folded Poly(Vinyl Chloride) (PVC) Pipe for Existing Sewer and Conduit Rehabilitation
$29.00 $58.00