Your shopping cart is empty!
ASTM International, 01/01/2002
Publisher: ASTM
File Format: PDF
$32.00$65.00
Published:01/01/2002
Pages:13
Note:This product is unavailable in Russia, Ukraine, Belarus
This standard was transferred to SEMI (www.semi.org) May 2003
1.1 The purpose of this guide is to list, illustrate, and provide reference for various characteristic features and contaminants that are seen on highly specular silicon wafers. Recommended practices for delineation and observation of these artifacts are referenced. The artifacts described in this guide are intended to parallel and support the content of the SEMI M18. These artifacts and common synonyms are arranged alphabetically in Tables 1 and 2 and illustrated in Figs. 1-68 .
Standard Terminology Relating to Resilient Floor Coverings
$25.00 $50.00
Standard Specification for Aluminum-Bronze Sand Castings
$30.00 $60.00
Standard Test Method for Time of Setting of Hydraulic-Cement Paste by Gillmore Needles
$26.00 $52.00
Standard Test Methods for Instrumental Measurement of Distinctness-of-Image Gloss of Coating Surfaces
