Your shopping cart is empty!
ASTM International, 01/01/2011
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/01/2011
Pages:7
File Size:1 file , 92 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
$30.00 $60.00
Standard Test Method for Foam In Aqueous Media (Bottle Test) (Withdrawn 2013)
$26.00 $52.00
Standard Practice for Qualification of a Combination of Squeeze Tool, Pipe, and Squeeze-Off Procedures to Avoid Long-Term Damage in Polyethylene (PE) Gas Pipe
$25.00 $50.00
Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
