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ASTM International, 01/01/2003
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/01/2003
Pages:5
File Size:1 file , 46 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
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