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ASTM International, 01/10/2003
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:10/01/2003
Pages:6
File Size:1 file , 97 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
$32.00 $65.00
Standard Test Method for Protrusion Puncture Resistance of Stretch Wrap Film
$26.00 $52.00
Standard Guide for Transport Packaging Design
Standard Guide for Reconstitution of Irradiated Charpy-Sized Specimens
$25.00 $50.00
