ASTM F576-00

Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

ASTM International, 01/01/2000

Publisher: ASTM

File Format: PDF

$29.00$58.00

Published:01/01/2000

Pages:9

File Size:1 file , 280 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

Standard Classification System and Basis for Specification for Cellulose Acetate Butyrate Molding and Extrusion Compounds (CAB)

$34.00 $68.00

Standard Test Method for Determination of Acid Numbers of Hot-Melt Adhesives

$25.00 $50.00

Standard Specification for Crosslinked Polyethylene/Aluminum/Crosslinked Polyethylene (PEX-AL-PEX) Pressure Pipe

$32.00 $65.00

Standard Test Method for Cyclic Movement and Measuring the Minimum and Maximum Joint Widths of Architectural Joint Systems

$29.00 $58.00