ASTM F980-10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

ASTM International, 12/01/2010

Publisher: ASTM

File Format: PDF

$29.00$58.00

Published:01/12/2010

Pages:7

File Size:1 file , 160 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Standard Test Method for Determination of Low Levels of Water in Liquid Chlorine By Infrared Spectrophotometry

$29.00 $58.00

Standard Practice for Evaluating Apparent Grain Size and Distribution of Cemented Tungsten Carbides

$25.00 $50.00

Standard Specification for Nickel-Cobalt Alloy Coating

$32.00 $64.00

Standard Specification for Vegetable Peeling Machines, Electric

$29.00 $58.00