• ASTM F980-10e1

ASTM F980-10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

ASTM International, 12/01/2010

Publisher: ASTM

File Format: PDF

$29.00$58.00


Published:01/12/2010

Pages:7

File Size:1 file , 160 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

More ASTM standard pdf

ASTM E1497-00

ASTM E1497-00

Standard Practice for Safe Use of Water-Miscible Metal Removal Fluids

$29.00 $58.00

ASTM D1071-83(2008)

ASTM D1071-83(2008)

Standard Test Methods for Volumetric Measurement of Gaseous Fuel Samples (Withdrawn 2017)

$33.00 $67.00

ASTM D6522-00

ASTM D6522-00

Standard Test Method for Determination of Nitrogen Oxides, Carbon Monoxide, and Oxygen Concentrations in Emissions from Natural Gas-Fired Reciprocating Engines, Combustion Turbines, Boilers, and Process Heaters Using Portable Analyzers

$24.00 $49.20

ASTM D3749-08

ASTM D3749-08

Standard Test Method for Residual Vinyl Chloride Monomer in Poly(Vinyl Chloride) Resins by Gas Chromatographic Headspace Technique

$26.00 $52.00