ASTM F980-10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

ASTM International, 12/01/2010

Publisher: ASTM

File Format: PDF

$29.00$58.00

Description

Published:01/12/2010

Pages:7

File Size:1 file , 160 KB

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