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ASTM International, 01/01/1996
Publisher: ASTM
File Format: PDF
$29.00$58.00
Published:01/01/1996
Pages:5
File Size:1 file , 48 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
1.1 This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from neutron radiation. This test will produce degradation of the electrical properties of the irradiated devices and should be considered a destructive test. Rapid annealing of displacement damage is usually associated with bipolar technologies.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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