• ASTM F996-11

ASTM F996-11

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

ASTM International, 01/01/2011

Publisher: ASTM

File Format: PDF

$29.00$58.00


Published:01/01/2011

Pages:7

File Size:1 file , 120 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

1.1 This test method covers the use of the subthreshold charge separation technique for analysis of ionizing radiation degradation of a gate dielectric in a metal-oxide-semiconductor-field-effect transistor (MOSFET) and an isolation dielectric in a parasitic MOSFET. , , The subthreshold technique is used to separate the ionizing radiation-induced inversion voltage shift, ΔVINV into voltage shifts due to oxide trapped charge, ΔVot and interface traps, ΔVit. This technique uses the pre- and post-irradiation drain to source current versus gate voltage characteristics in the MOSFET subthreshold region.

1.2 Procedures are given for measuring the MOSFET subthreshold current-voltage characteristics and for the calculation of results.

1.3 The application of this test method requires the MOSFET to have a substrate (body) contact.

1.4 Both pre- and post-irradiation MOSFET subthreshold source or drain curves must follow an exponential dependence on gate voltage for a minimum of two decades of current.

1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

More ASTM standard pdf

ASTM D5924-96(2010)

ASTM D5924-96(2010)

Standard Guide for Selection of Simulation Approaches in Geostatistical Site Investigations

$26.00 $52.00

ASTM C1184-00ae1

ASTM C1184-00ae1

Standard Specification for Structural Silicone Sealants

$26.00 $52.00

ASTM D3798-00

ASTM D3798-00

Standard Test Method for Analysis of p-Xylene by Gas Chromatography

$29.00 $58.00

ASTM D7360-16

ASTM D7360-16

Standard Test Method for Analysis of Benzene by Gas Chromatography with External Calibration (Withdrawn 2023)

$24.00 $48.00