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  • ASTM F996-98(2003)

ASTM F996-98(2003)

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

ASTM International, 01/01/2003

Publisher: ASTM

File Format: PDF

$29.00$58.00


Published:01/01/2003

Pages:7

File Size:1 file , 89 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

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