• Your shopping cart is empty!

  • ASTM F996-98(2003)

ASTM F996-98(2003)

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

ASTM International, 01/01/2003

Publisher: ASTM

File Format: PDF

$29.00$58.00


Published:01/01/2003

Pages:7

File Size:1 file , 89 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

More ASTM standard pdf

ASTM D1746-15

ASTM D1746-15

Standard Test Method for Transparency of Plastic Sheeting

$30.00 $60.00

ASTM B643-12

ASTM B643-12

Standard Specification for Copper-Beryllium Alloy Seamless Tube

$30.00 $60.00

ASTM C1577-15a

ASTM C1577-15a

Standard Specification for Precast Reinforced Concrete Monolithic Box Sections for Culverts, Storm Drains, and Sewers Designed According to AASHTO LRFD

$41.00 $83.00

ASTM B138/B138M-01

ASTM B138/B138M-01

Standard Specification for Manganese Bronze Rod, Bar, and Shapes

$26.00 $52.00