ASTM F996-98(2003)

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

ASTM International, 01/01/2003

Publisher: ASTM

File Format: PDF

$29.00$58.00

Description

Published:01/01/2003

Pages:7

File Size:1 file , 89 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

More ASTM standard pdf

ASTM F1912-19

Standard Specification for Safety of Bean Bag Chairs and Bean Bag Covers

$27.00 $54.00

ASTM E299-08

Standard Test Method for Trace Amounts of Peroxides In Organic Solvents

$26.00 $52.00

ASTM C94/C94M-21a

Standard Specification for Ready-Mixed Concrete

$36.00 $72.00

ASTM D7251-10

Standard Specification for Color and Appearance Retention of Variegated Color Plastic Siding Products

$30.00 $60.00