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ASTM International, 11/01/2009
Publisher: ASTM
File Format: PDF
$120.00$241.33
Published:01/11/2009
Pages:1060
Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe (Withdrawn 2003)
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Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage (Withdrawn 2003)
Standard Specification for Trailers Used for Measuring Vehicular Response to Road Roughness
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Standard Specification for Magnesium-Alloy Forgings
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