BS 05/30135664 DC

IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method of components for handheld electronic products

BSI Group, 06/30/2005

Publisher: BS

File Format: PDF

$107.00$215.94

Description

Published:30/06/2005

Pages:20

Cross References:
IEC 60749-10
IEC 60749-20
IEC 60749-20-1

All current amendments available at time of purchase are included with the purchase of this document.

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