BS 08/30172398 DC

BS EN 62047-8. Semiconductor devices. Micro- electromechanical devices. Part 8. Strip bending test method for tensile property measurement of thin films

BSI Group, 02/18/2008

Publisher: BS

File Format: PDF

$111.00$223.48

Published:18/02/2008

Pages:16

Cross References:
IEC 62047-1:2005
IEC 62047-2:2006
IEC 62047-3:2006
ISO 6892:1998
ISO 15490:2000

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