BS 09/30190356 DC

BS EN 60749-40. Semiconductor devices. Mechanical and climatic test methods. Part 40. Board level drop test method using a strain gauge

BSI Group, 03/24/2009

Publisher: BS

File Format: PDF

$139.00$278.72

Description

Published:24/03/2009

Pages:24

Cross References:
IEC 60749-10
IEC 60749-20
IEC 60749-20-1
IEC 60749-37

All current amendments available at time of purchase are included with the purchase of this document.

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