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BSI Group, 11/24/2009
Publisher: BS
File Format: PDF
$131.00$262.92
Published:24/11/2009
Pages:104
Guide to methods for the assessment of the influence of crack growth on the significance of defects in components operating at high temperatures
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Specification for split pins (metric series)
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Information technology. Functional standard for profile A/MH31. Message handling systems (1988 and later). Electronic data interchange messaging service (EDIMS). EDIM end system to EDIM end system (P EDI and P1)
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Calibration of vibration and shock pick-ups-Method of test for resonance frequency of undamped accelerometers on a steel block