BS 09/30209746 DC

BS EN 60749-29. Semiconductor devices. Mechanical and climatic test methods. Part 29. Latch-up test

BSI Group, 09/08/2009

Publisher: BS

File Format: PDF

$130.00$260.13

Description

Published:08/09/2009

Pages:25

All current amendments available at time of purchase are included with the purchase of this document.

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