BS 11/30231583 DC

BS EN 62047-17. Semiconductor devices. Micro-electromechanical devices Part 17. Bulge test method for measuring mechanical properties of thin films

BSI Group, 03/08/2011

Publisher: BS

File Format: PDF

$136.00$272.94

Published:08/03/2011

Pages:26

Cross References:
IEC 62047-2:2006

All current amendments available at time of purchase are included with the purchase of this document.

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