BS 11/30231583 DC

BS EN 62047-17. Semiconductor devices. Micro-electromechanical devices Part 17. Bulge test method for measuring mechanical properties of thin films

BSI Group, 03/08/2011

Publisher: BS

File Format: PDF

$136.00$272.94

Published:08/03/2011

Pages:26

Cross References:
IEC 62047-2:2006

All current amendments available at time of purchase are included with the purchase of this document.

ISO 13292. Copper, lead, zinc and nickel concentrates. Experimental methods for checking the bias of sampling

$131.00 $263.89

EN 15275. Structural adhesives. Characterisation of anaerobic adhesives for co-axial metallic assembly in building and civil engineering structures

$140.00 $280.72

The Intrastat system. The implementation model

$102.00 $205.74

EN ISO 22476-7. Geotechnical investigation and testing. Field testing. Part 7. Borehole jack test

$149.00 $298.78