BS 12/30235353 DC

BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

BSI Group, 01/30/2012

Publisher: BS

File Format: PDF

$133.00$266.17

Description

Published:30/01/2012

Pages:34

All current amendments available at time of purchase are included with the purchase of this document.

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