BS 2011-2J:1963

Basic methods for the climatic and durability testing of components for telecommunication and allied electronic equipment. Mould growth

BSI Group, 01/01/1971

Publisher: BS

File Format: PDF

$125.00$251.46

Published:01/01/1971

Note:This product is unavailable in Ukraine, Russia, Belarus

All current amendments available at time of purchase are included with the purchase of this document.

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