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  • BS 5913:1980

BS 5913:1980

Method of measuring and defining the characteristics of anti-scatter grids used in X-ray equipment

BSI Group, 03/31/1980

Publisher: BS

File Format: PDF

$145.00$291.77


Published:31/03/1980

Pages:24

Definition and methods of measuring the characteristics of anti-scatter grids used to improve the contrast of the X-ray patterns for medical purposes.

All current amendments available at time of purchase are included with the purchase of this document.

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