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BSI Group, 12/31/2008
Publisher: BS
File Format: PDF
$90.00$180.34
Published:31/12/2008
Pages:16
File Size:1 file , 240 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
Methods of test for tea-Determination of loss in mass at 103°C
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Specification for letter symbols for semiconductor devices and integrated microcircuits
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Specification for image quality indicators for industrial radiography (including guidance on their use)
$125.00 $251.46
Nickel and nickel alloys: sheet and plate