BS 9300 C644:1971

Detail specification for silicon n-p-n planar epitaxial transistors

BSI Group, 03/15/1971

Publisher: BS

File Format: PDF

$125.00$251.46

Description

Published:15/03/1971

Note:This product is unavailable in Ukraine, Russia, Belarus

All current amendments available at time of purchase are included with the purchase of this document.

More BS standard pdf

BS 06/30156380 DC

BS ISO 1795. Rubber, raw natural and raw synthetic. Sampling and further preparative procedures

$137.00 $274.96

BS 06/30140009 DC

EN 12543-2. Non-destructive testing. Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing. Part 2. Pinhole camera radiographic method

$108.00 $217.58

BS 06/30140276 DC

EN 473. Non-destructive testing. Qualification and certification of NDT personnel. General principles

$129.00 $259.37

BS 06/30131928 DC

ISO 22263. Organization of information about construction works. Framework for project management

$123.00 $246.58