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  • BS DD 174:1988

BS DD 174:1988

Guide to the calibration and setting up of the ultrasonic time of flight diffraction (TOFD) technique for the location and sizing of flaws

BSI Group, 01/01/1989

Publisher: BS

File Format: PDF

$90.00$180.34


Published:01/01/1989

Pages:20

File Size:1 file

Note:This product is unavailable in Ukraine, Russia, Belarus

The two transducer version of TOFD used to locate and size flaws as a result of linear scanning. Appendices provide a preliminary classification of defects and brief description of special techniques based on TOFD.

All current amendments available at time of purchase are included with the purchase of this document.

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