BS DD ENV 50218:1996

Description of a parametrized European mini test chip

BSI Group, 09/15/1996

Publisher: BS

File Format: PDF

$90.00$180.34

Description

Published:15/09/1996

Pages:22

File Size:1 file , 1.1 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).

Cross References:
CENELEC R117-001
CENELEC R117-004
CENELEC R117-005
CENELEC R117-006
CENELEC R117-10
CENELEC prENV 50208-6
CENELEC ENV 50219

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