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BSI Group, 07/31/2022
Publisher: BS
File Format: PDF
$87.00$175.26
Published:31/07/2022
Pages:22
File Size:1 file , 830 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
Methods of test for tea-Determination of loss in mass at 103°C
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Specification for letter symbols for semiconductor devices and integrated microcircuits
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Specification for image quality indicators for industrial radiography (including guidance on their use)
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Nickel and nickel alloys: sheet and plate