BS PD IEC TR 63258:2021

Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films

BSI Group, 03/25/2021

Publisher: BS

File Format: PDF

$125.00$251.46

Description

Published:25/03/2021

Pages:24

File Size:1 file , 1.1 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

This document, which is a Technical Report, is focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.

All current amendments available at time of purchase are included with the purchase of this document.

More BS standard pdf

BS 2497-7:1988

Standard reference zero for the calibration of pure tone air conduction audiometers-Specification for a standard reference zero at frequencies intermediate between those given in Parts 5 and 6 of BS 2497

$76.00 $152.40

BS 4921:1988

Specification for sherardized coatings on iron or steel

$76.00 $152.40

BS 4559-9.1:1988

Methods for preparation of calibration gas mixtures. Comparison methods and methods for establishing traceability-Determination of composition by comparison methods

$76.00 $152.40

BS G 240:1988

Specification for pressure transducers for use on aircraft

$76.00 $152.40