BS PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions. Near-field scan data exchange format

BSI Group, 09/30/2015

Publisher: BS

File Format: PDF

$175.00$350.52


Published:30/09/2015

Pages:68

File Size:1 file , 1.6 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

BS PD IEC/TR 61967-1-1:2015 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.


Cross References:
IEC 60050
IEC 61967-1
ISO 8879
ANSI INCITS 4:1986
IEEE Std 754-2008
IEC TS 61967-3
IEC TS 62132-9
IEC 60050-131
IEC 60050-161
IEC 62132-1


All current amendments available at time of purchase are included with the purchase of this document.

More BS standard pdf

BS 7394-2:1994

BS 7394-2:1994

Complete spectacles-Specification for prescription spectacles

$76.00 $152.40

BS 2037:1994

BS 2037:1994

Specification for portable aluminium ladders, steps, trestles and lightweight stagings

$125.00 $251.46

BS 7164-11.1:1994

BS 7164-11.1:1994

Chemical tests for raw and vulcanized rubber. Butadiene rubber-Method for determination of microstructure

$76.00 $152.40

BS CECC 90115:1994

BS CECC 90115:1994

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits

$90.00 $180.34