BS PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

BSI Group, 01/29/2018

Publisher: BS

File Format: PDF

$90.00$180.34

Description

Published:29/01/2018

Pages:20

File Size:1 file , 1.4 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Cross References:
IEEE 1149.1:2013

All current amendments available at time of purchase are included with the purchase of this document.

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