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BSI Group, 08/31/2016
Publisher: BS
File Format: PDF
$125.00$251.46
Published:31/08/2016
Pages:28
File Size:1 file , 2.3 MB
Note:This product is unavailable in Ukraine, Russia, Belarus
Methods of test for tea-Determination of loss in mass at 103°C
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Specification for letter symbols for semiconductor devices and integrated microcircuits
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Specification for image quality indicators for industrial radiography (including guidance on their use)
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Nickel and nickel alloys: sheet and plate