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BS PD ISO/TR 21477:2017

Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems

BSI Group, 09/27/2017

Publisher: BS

File Format: PDF

$76.00$152.40


Published:27/09/2017

Pages:12

File Size:1 file , 680 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

BS PD ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.


Cross References:
ISO 14997:2017
ISO 10110-7:2017
ISO 10110-1:2006
ISO 3


All current amendments available at time of purchase are included with the purchase of this document.

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