BS QC 750100:1986

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

BSI Group, 12/31/1986

Publisher: BS

File Format: PDF

$62.00$125.98

Description

Published:31/12/1986

Pages:20

File Size:1 file , 580 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.

Cross References:
BS 2011:Part 2.1Q
BS 3934
BS 6493:Section 1. 1
BS 6493:Section 1.2
BS 6493:Section 1.3
BS 6493:Section 1.6
BS 6493:Section 1.8
BS 6493:Part 3
BS 9000:Part 1
BS 9970:Part 0
IEC 747
IEC 748
IEC 749
IEC 47(Central Office)756
IEC 47(Central Office)810
IEC 47(Central Office)886
IEC 47(Central Office)887
IEC 47(Central Office)888
IEC 47(Central Office)891
IEC 47(Central Office)892
IEC 47(Central Office)955

BS QC 750100:1986

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

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