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BSI Group, 07/15/1999
Publisher: BS
File Format: PDF
$134.00$269.98
Published:15/07/1999
Pages:48
Open systems interconnection: specification for internal organization of the Network Layer
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Rules for the preparation of detail specifications for semiconductor devices of assessed quality: variable capacitance diodes for tuning applications
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Testing of engineering ceramics. General and textural properties-Method for determination of the presence of cracks and other defects by dye penetration tests
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Specification for universal modular fuses